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Ion-beam cross-section preparation for SEM workflows.
Official JEOL Scientific cross-section polisher mapped to laboratory sample preparation and microscopy preparation.
Laboratoriyangiz uchun konfiguratsiya, yetkazib berish va o‘rnatish talablarini aniqlashtiramiz.
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Uzbekistan
So‘rov bo‘yicha
Kazakhstan
So‘rov bo‘yicha
Mahsulot haqida

Микроскопия
JSM-IT HR Series · JSM-IT710HR
Нанометр даражадаги тасвир ва таҳлил учун юқори аниқликдаги SEM.

Микроскопия
JIB Series · JIB-PS500i
Focused ion beam and SEM platform for advanced sample preparation and analysis.