
Premium ilmiy uskuna
Focused ion beam and SEM platform for advanced sample preparation and analysis.
Official JEOL Scientific FIB product mapped to FIB, FIB-SEM and microscopy sample-preparation workflows.
Laboratoriyangiz uchun konfiguratsiya, yetkazib berish va o‘rnatish talablarini aniqlashtiramiz.
Hududiy mavjudlik
Uzbekistan
So‘rov bo‘yicha
Kazakhstan
So‘rov bo‘yicha
Mahsulot haqida

Микроскопия
JSM-IT HR Series · JSM-IT710HR
Нанометр даражадаги тасвир ва таҳлил учун юқори аниқликдаги SEM.

Намуна тайёрлаш
IB Series · IB-19530CP
Ion-beam cross-section preparation for SEM workflows.