
Premium ilmiy uskuna
Field-emission TEM for high-throughput materials characterization.
Official JEOL Scientific TEM model mapped to microscopy, STEM and materials characterization workflows.
Laboratoriyangiz uchun konfiguratsiya, yetkazib berish va o‘rnatish talablarini aniqlashtiramiz.
Hududiy mavjudlik
Uzbekistan
So‘rov bo‘yicha
Kazakhstan
So‘rov bo‘yicha
Mahsulot haqida

Микроскопия
JSM-IT HR Series · JSM-IT710HR
Нанометр даражадаги тасвир ва таҳлил учун юқори аниқликдаги SEM.

Микроскопия
JXA-iHP Series · JXA-iHP200F
EPMA for quantitative elemental analysis and materials research.