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Suggested equipment
EquipmentJSM-IT710HR Schottky Field Emission SEM
High-resolution SEM for nanometer-scale imaging and analysis.
EquipmentJEM-F200 Multipurpose Electron Microscope
Field-emission TEM for high-throughput materials characterization.
EquipmentJXA-iHP200F Field Emission Electron Probe Microanalyzer
EPMA for quantitative elemental analysis and materials research.
EquipmentJIB-PS500i FIB-SEM
Focused ion beam and SEM platform for advanced sample preparation and analysis.
EquipmentIB-19530CP Cross Section Polisher
Ion-beam cross-section preparation for SEM workflows.
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